Fitting of full X-ray diffraction patterns is an effective method for quantifying abundances during X-ray diffraction (XRD) analyses. The method is based on the principal that the observed diffraction ...

The museum operates without structural government subsidy, offering a degree of freedom that Schnyder acknowledges is an ...

Abstract: We present an approach to separating reflection from a single image. The approach uses a fully convolutional network trained end-to-end with losses that exploit low-level and high-level ...

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