EDN

Concurrent test points way to PCB quality

Stutensee, GermanyHans Baka started to work for Digitaltest in Stutensee in 1994 as marketing and sales manager and became managing director in 1997. Before joining Digitaltest, he held ...
EDN

Intellitech offers new Concurrent JTAG test platform

International Test Conference- Santa Clara, CA – Business Wire – October 25th, 2007 — Intellitech Corporation, www.intellitech.com, the leader in lowering electronic product costs through IEEE ...
Semiconductor Engineering

Concurrent Test

Derek Wu, senior staff applications engineer at Advantest, looks at the need for doing multiple tests at the same time as chip designs become more complex, increasingly heterogeneous, and much more ...
Security

Raytheon Receives $22.9 Million to Develop Initial Concurrent Test, Training and Operations Capability

TEWKSBURY, Mass., March 27, 2008 /PRNewswire/ -- The Missile Defense Agency has awarded a $22.9 million contract modification to Raytheon Company (NYSE: RTN) to develop an initial Concurrent Test, ...
Electronic Design

Convergent SOCs Challenge Mixed-Signal Test

As the consumer market for voice, audio, video, and data services evolves, the SOC test platform must unite a variety of leading-edge test capabilities. After talking about it for years, convergence ...
Electronic Design

Reining in the Cost of Test

IC complexity continues to rise while the cost of silicon keeps dropping in accordance with Moore’s Law. More ICs now are being implemented as system-on-a-chip (SOC), including communications ICs, ...